US PATENT SUBCLASS 702 / 183
.~.~ Diagnostic analysis


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
182  DF  .~ Performance or efficiency evaluation {2}
183.~.~ Diagnostic analysis {2}
184  DF  .~.~.~> Maintenance
185  DF  .~.~.~> Cause or fault identification


DEFINITION

Classification: 702/183

Diagnostic analysis:

(under subclass 182) Subject matter including means for monitoring or determining operation parameter to perform diagnosis of an abnormal operational condition or fault on the device or the process.

(1) Note. This subclass includes a self-diagnosis device.

SEE OR SEARCH THIS CLASS, SUBCLASS:

58+, for electrical fault detection.

63, for battery monitoring.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

500+, for fault detecting in electrical circuits or electric components. 364, Electrical Computers and Data Processing Systems,

528.27, for system protection in a power generation or distribution system.

714, Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses for reliability, availability and computer related fault handling.