US PATENT SUBCLASS 702 / 16
.~.~.~ Specific display system (e.g., mapping, profiling)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
2  DF  .~ Earth science {4}
14  DF  .~.~ Seismology {4}
16.~.~.~ Specific display system (e.g., mapping, profiling)

DEFINITION

Classification: 702/16

Specific display (e.g., mapping, profiling):

(under subclass 14) Subject matter including (a) means for carrying out a series of steps in a sequence (e.g., mapping, profiling, etc.) to generate a visual presentation of data or (b) structural details of means for displaying data.

SEE OR SEARCH THIS CLASS, SUBCLASS:

5, for topography (e.g., land mapping).

67+, for display of a measured waveform.

SEE OR SEARCH CLASS

345, Computer Graphics Processing, Operator Interface Processing, and Selective Visual Display Systems, appropriate subclasses.

367, Communications, Electrical: Acoustic Wave Systems and Devices,

68+, for display systems in land-reflection type seismic prospecting.