US PATENT SUBCLASS 702 / 140
.~.~ Within an enclosure

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
138  DF  .~ Pressure {2}
140.~.~ Within an enclosure

DEFINITION

Classification: 702/140

Within an enclosure:

(under subclass 138) Subject matter wherein pressure within a closed container is measured.