US PATENT SUBCLASS 438 / FOR 101
.~.~ Measuring, testing, or inspecting (156/626.1)

Current as of: June, 1999
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438 /   HD   SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS

983  DF  ZENER DIODES {1}
FOR 100  DF  .~ Etching of semiconductor precursor, substrates, and devices used in an electrical function (156/625.1) {17}
FOR 101.~.~ Measuring, testing, or inspecting (156/626.1) {1}
FOR 102  DF  .~.~.~> By electrical means or of electrical property (156/627.1)

DEFINITION

Classification: 438/FOR.101

Measuring, testing, or inspecting:

Foreign art collection for processes including the step of visually, chemically, or physically determining or measuring a variable condition or property of the substrate.