US PATENT SUBCLASS 382 / 151
.~.~.~ Alignment, registration, or position determination

Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

100  DF  APPLICATIONS {20}
141  DF  .~ Manufacturing or product inspection {5}
145  DF  .~.~ Inspection of semiconductor device or printed circuit board {5}
151.~.~.~ Alignment, registration, or position determination

DEFINITION

Classification: 382/151

Alignment, registration, or position determination:

(under subclass 145) Subject matter wherein semiconductor or other electrical component devices are inspected to determine position or alignment with respect to a process mask or during installation.