US PATENT SUBCLASS 382 / 149
.~.~.~ Fault or defect detection

Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

100  DF  APPLICATIONS {20}
141  DF  .~ Manufacturing or product inspection {5}
145  DF  .~.~ Inspection of semiconductor device or printed circuit board {5}
149.~.~.~ Fault or defect detection {1}
150  DF  .~.~.~.~> Faulty soldering

DEFINITION

Classification: 382/149

Fault or defect detection:

(under subclass 145) Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.