US PATENT SUBCLASS 382 / 148
.~.~.~ At plural magnifications or resolutions

Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

100  DF  APPLICATIONS {20}
141  DF  .~ Manufacturing or product inspection {5}
145  DF  .~.~ Inspection of semiconductor device or printed circuit board {5}
148.~.~.~ At plural magnifications or resolutions

DEFINITION

Classification: 382/148

At plural magnifications or resolution:

(under subclass 145) Subject matter wherein inspection is performed at more than one image magnification or resolution.