US PATENT SUBCLASS 382 / 146
.~.~.~ Measuring external leads


Current as of: June, 1999
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382 /   HD   IMAGE ANALYSIS

100  DF  APPLICATIONS {20}
141  DF  .~ Manufacturing or product inspection {5}
145  DF  .~.~ Inspection of semiconductor device or printed circuit board {5}
146.~.~.~ Measuring external leads


DEFINITION

Classification: 382/146

Measuring external leads:

(under subclass 145) Subject matter wherein external leads of a component are inspected, such as for coplanarity, shape, or alignment prior to insertion into a printed circuit board or the like.