US PATENT SUBCLASS 378 / 90
.~.~.~.~ Plural diverse X-ray analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
86  DF  .~.~ Scatter analysis {3}
89  DF  .~.~.~ Thickness or density analysis {1}
90.~.~.~.~ Plural diverse X-ray analysis

DEFINITION

Classification: 378/90

Plural diverse X-ray analyses:

(under subclass 89) Subject matter including some type of X-ray analysis of the analyte in addition to scatter type thickness or density analysis.