US PATENT SUBCLASS 378 / 89
.~.~.~ Thickness or density analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
86  DF  .~.~ Scatter analysis {3}
89.~.~.~ Thickness or density analysis {1}
90  DF  .~.~.~.~> Plural diverse X-ray analysis

DEFINITION

Classification: 378/89

Thickness or density analysis:

(under subclass 86) Subject matter including measurement of the thickness or density of an object such as a sheet or coating.

(1) Note. This measurement is typically accomplished by comparing the modification in direction of X-rays as a result of their interaction with an object under examination with the modification in direction produced by a reference object of known thickness or density.

SEE OR SEARCH THIS CLASS, SUBCLASS:

50, for fluorescence thickness or density analysis.

54+, for absorption thickness or density analysis.

SEE OR SEARCH CLASS

73, Measuring and Testing,

152.05+, for measuring density within a borehole.