US PATENT SUBCLASS 378 / 80
.~.~.~.~ With environmental control

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
71  DF  .~.~ Diffractometry {3}
79  DF  .~.~.~ Analyte support {2}
80.~.~.~.~ With environmental control

DEFINITION

Classification: 378/80

With environmental control:

(under subclass 79) Subject matter including means to alter the pressure, temperature, or composition of the atmosphere surrounding the analyte.