US PATENT SUBCLASS 349 / 54
.~.~ Matrix including additional element (s) which correct or compensate for electrical fault

Current as of: June, 1999
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349 /   HD   LIQUID CRYSTAL CELLS, ELEMENTS AND SYSTEMS

19  DF  PARTICULAR EXCITATION OF LIQUID CRYSTAL {6}
33  DF  .~ Electrical excitation of liquid crystal (i.e., particular voltage pulses, AC vs. DC, threshold voltages, etc.) {8}
54.~.~ Matrix including additional element (s) which correct or compensate for electrical fault {1}
55  DF  .~.~.~> Laser links

DEFINITION

Classification: 349/54

Matrix including additional element(s) which correct or compensate for electrical fault:

(under subclass 33) Subject matter including a structure or arrangement of additional buses, switching elements, or circuit elements for correcting and preventing electrical defects such as open or short circuits.

(1) Note. The defect correction structure included in this subclass is that which is incorporated in the liquid crystal device when the device is manufactured. Excluded from this subclass are defect correction after the device has been made. For such excluded subject matter, see SEARCH THIS CLASS, SUBCLASS below.

(2) Note. Included here are double buslines, double switches, and bypass lines. Also included are pixels connected directly to the busline to reduce defects.

SEE OR SEARCH THIS CLASS, SUBCLASS:

192, for defect correction after the liquid crystal device has been made.

SEE OR SEARCH CLASS

345, Computer Graphics Processing, Operator Interface Processing, and Selective Visual Display Systems, 93, for the use of redundancy in a liquid crystal device.