US PATENT SUBCLASS 348 / 129
.~.~ By comparison with reference object


Current as of: June, 1999
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61  DF  SPECIAL APPLICATIONS {15}
125  DF  .~ Flaw detector {6}
129.~.~ By comparison with reference object {1}
130  DF  .~.~.~> With stored representation of reference object


DEFINITION

Classification: 348/129

By comparison with reference object:

(under subclass 125) Subject matter wherein the picture signals of a viewed object is compared with signals representative of a standard to provide an indication of whether imperfections exist in the object.