US PATENT SUBCLASS 348 / 125
.~ Flaw detector

Current as of: June, 1999
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348 /   HD   TELEVISION

61  DF  SPECIAL APPLICATIONS {15}
125.~ Flaw detector {6}
126  DF  .~.~> Of electronic circuit chip or board
127  DF  .~.~> Of transparent container or content (e.g., bottle, jar, etc.)
128  DF  .~.~> Of surface (e.g., texture or smoothness, etc.)
129  DF  .~.~> By comparison with reference object {1}
131  DF  .~.~> With specific illumination detail {1}
133  DF  .~.~> With circuit detail {1}

DEFINITION

Classification: 348/125

Flaw detector:

(under subclass 61) Subject matter wherein a picture signal generator is utilized to view an object and the signals so

generated produce a display whereby imperfections in the object may be visually observed, or wherein the signals generated are compared with signals representative of a standard to provide an indication of whether imperfections exist in the object.

SEE OR SEARCH CLASS

73, Measuring and Testing,

600, for flaw detection by measuring velocity or propagation time of beamed mechanical waves.

250, Radiant Energy,

562+, and 572 for photocell operated devices for evaluating and detecting defects in a sheet.

324, Electricity: Measuring and Testing, 200+, for flaw testing using magnetic effect.

356, Optics: Measuring and Testing,

426+, for optical inspection of an article with agitation or rotation; subclasses 429+ for inspection of moving webs or thread; and subclasses 237.1+ for optical systems for detecting flaws or imperfections.

382, Image Analysis, appropriate subclasses for flaw detection by image analysis.