(under the class definition) Subject matter wherein the logic circuit includes a specific circuit or device to enable a testing function to be performed (e.g., a bypass circuit that connects a signal input directly to an output, thus bypassing the logic circuit for a testing purpose, etc.).
(1) Note. This subclass comprises the testing facilitation of digital logic circuits; however, when the information content of a digital logic signal is involved, classification is elsewhere, see SEE OR SEARCH CLASS, below.
(2) Note. Class 324 is the residual class for any test that involves the testing of electrical device parameters.
SEE OR SEARCH THIS CLASS, SUBCLASS:
37, for multifunctional or programmable logic circuitry.
SEE OR SEARCH CLASS
324, Electricity: Measuring and Testing,
73.1+, for automatic sequential testing of electrical parameters. 714, Error Detection/Correction and Fault Detection/Recovery,
724+, for testing of information content of a digital logic signal.
