US PATENT SUBCLASS 257 / 490
.~.~ Combined with floating pn junction guard region


Current as of: June, 1999
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257 /   HD   ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES)

487  DF  WITH MEANS TO INCREASE BREAKDOWN VOLTAGE THRESHOLD {6}
488  DF  .~ Field relief electrode {2}
490.~.~ Combined with floating pn junction guard region


DEFINITION

Classification: 257/490

Combined with floating pn junction guard region:

(under subclass 488) Subject matter wherein the means for increasing breakdown voltage includes, in addition to a field relief electrode, a floating pn junction guard region, i.e., a region free of direct electrical connection located in the material forming one side of an active pn, or other rectifying semiconductor junction, which region forms a pn junction with the material of the one side of the active junction, the guard region being spaced from the active junction, but sufficiently close thereto that the reverse bias depletion region from the active junction can reach the guard junction, whereby the guard junction modifies the shape of the depletion region from the active junction thus lowering the electric field intensity at a given applied reverse voltage across the active junction.