US PATENT SUBCLASS 73 / 627
.~.~.~ By reflected wave

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
584  DF  .~ By mechanical waves {13}
596  DF  .~.~ Beamed {10}
627.~.~.~ By reflected wave {2}
628  DF  .~.~.~.~> Having plural sonic type transmitters or receivers tranducers
629  DF  .~.~.~.~> Having unitary sonic type transmitter-receiver transducer {2}

DEFINITION

Classification: 73/627

By reflected wave:

(under subclass 596) Subject matter wherein the wave energy is reflected from a reflecting surface of the test body and received, and the measurement of the reflected wave determines the location of flaws, thickness, etc.

(1) Note. Detection of the presence or absence of a flaw by measurement of the time of propagation or the attenuation of the waves in the body is in this class, subclasses 598 and 600, respectively.