US PATENT SUBCLASS 73 / 619
.~.~.~.~ Programmed scan

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

570  DF  VIBRATION {10}
584  DF  .~ By mechanical waves {13}
596  DF  .~.~ Beamed {10}
618  DF  .~.~.~ Measuring or testing system having scanning means {2}
619.~.~.~.~ Programmed scan

DEFINITION

Classification: 73/619

Programmed scan:

(under subclass 618) Subject matter wherein the scanning is automatically controlled in accordance with a previously recorded program.