US PATENT SUBCLASS 73 / 31.05
.~ Detector detail

Current as of: June, 1999
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73 /   HD   MEASURING AND TESTING

23.2  DF  GAS ANALYSIS {15}
31.05.~ Detector detail {1}
31.06  DF  .~.~> Semiconductor

DEFINITION

Classification: 73/31.05

Detector detail:

(under subclass 23.2) Subject matter wherein significance is attributed to the sensing means.