US PATENT SUBCLASS 702 / FOR 133
.~.~ Atomic or nuclear physics (364/527)
Current as of:
June, 1999
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702 /
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DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
*
DD
APPLICATIONS (364/400)
{1}
FOR 130
DF
.~ Physics (364/524) {2}
FOR 133
.~.~ Atomic or nuclear physics (364/527)
DEFINITION
Classification: 702/FOR.133
Atomic or nuclear physics:
Foreign art collections wherein a data processing system or a calculating computer is utilized in the study of subatomic particles.