US PATENT SUBCLASS 702 / 86
.~ Linearization of measurement

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

85  DF  CALIBRATION OR CORRECTION SYSTEM {18}
86.~ Linearization of measurement

DEFINITION

Classification: 702/86

Linearization of measurement:

(under subclass 85) Subject matter comprising means for reforming non-linear measurement signal to conform to a desired linear characteristic.

SEE OR SEARCH CLASS

364, Electrical Computers and Data Processing Systems,

700+, and 800+ for digital or analog linearization means, respectively.