US PATENT SUBCLASS 438 / FOR 142
INCLUDING TESTING OR MEASURING (437/8)
Current as of:
June, 1999
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438 /
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SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS
FOR 142
INCLUDING TESTING OR MEASURING (437/8)
DEFINITION
Classification: 438/FOR.142
INCLUDING TESTING OR MEASURING:
Foreign art collection for a process having the step of measuring, or testing, a condition of the process or the device made thereby.
