US PATENT SUBCLASS 378 / 88
.~.~.~ Composition analysis


Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
86  DF  .~.~ Scatter analysis {3}
88.~.~.~ Composition analysis


DEFINITION

Classification: 378/88

Composition analysis:

(under subclass 86) Subject matter including measurement of the chemical composition, quantity (density), or presence of a specific substance in an analyte.

(1) Note. The measurement is typically accomplished by deflection analysis of the X-rays modified in direction by the analyte and comparing the deflection with reference data from substances of known composition.

SEE OR SEARCH THIS CLASS, SUBCLASS:

45, for fluorescence composition analysis.

53, for absorption composition analysis.

83, for spatial energy dispersion composition analysis.

SEE OR SEARCH CLASS

250, Radiant Energy, 253, for geological surveying.