US PATENT SUBCLASS 378 / 83
.~.~.~ Composition analysis


Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
70  DF  .~ Diffraction, reflection, or scattering analysis {3}
82  DF  .~.~ Spatial energy dispersion {2}
83.~.~.~ Composition analysis


DEFINITION

Classification: 378/83

Composition analysis:

(under subclass 82) Subject matter including measurement of the chemical composition, quantity (density), or presence of a specific substance in an analyte.

(1) Note. This subclass includes means for energy analyzing X-rays that have interacted with or have been produced by an analyte such as by scattering or radioactive decay for the purpose of determining analyte composition.

SEE OR SEARCH THIS CLASS, SUBCLASS:

45, or fluorescence composition analysis.

53, for absorption composition analysis.

88, for scatter type composition analysis.