US PATENT SUBCLASS 378 / 56
.~.~.~ With standardization

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
51  DF  .~ Absorption {7}
54  DF  .~.~ Thickness or density analysis {2}
56.~.~.~ With standardization

DEFINITION

Classification: 378/56

With standardization:

(under subclass 54) Subject matter including comparison of the attenuation of X-rays passing through the object under examination with the attentuation produced by a reference object of known thickness or density.