US PATENT SUBCLASS 378 / 54
.~.~ Thickness or density analysis

Current as of: June, 1999
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378 /   HD   X-RAY OR GAMMA RAY SYSTEMS OR DEVICES

1  DF  SPECIFIC APPLICATION {14}
51  DF  .~ Absorption {7}
54.~.~ Thickness or density analysis {2}
55  DF  .~.~.~> With movable source or detector
56  DF  .~.~.~> With standardization

DEFINITION

Classification: 378/54

Thickness or density analysis:

(under subclass 51) Subject matter including measurement of the thickness or density of an object such as a sheet or coating.

(1) Note. This measurement is typically accomplished by analyzing the attenuation of X-rays as a result of their passage through the object under examination.

SEE OR SEARCH THIS CLASS, SUBCLASS:

50, for fluorescence thickness or density analysis.

89+, for scatter type thickness or density analysis.

SEE OR SEARCH CLASS

73, Measuring and Testing,

152.05+, for measuring density within a borehole.