US PATENT SUBCLASS 374 / 178
.~.~ By barrier layer sensing element (e.g., semiconductor junction)

Current as of: June, 1999
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374 /   HD   THERMAL MEASURING AND TESTING

100  DF  TEMPERATURE MEASUREMENT (E.G., THERMOMETER) {13}
163  DF  .~ By electrical or magnetic heat sensor {13}
178.~.~ By barrier layer sensing element (e.g., semiconductor junction)

DEFINITION

Classification: 374/178

By barrier layer sensing element (e.g., semiconductor junction):

(under subclass 163) Subject matter wherein the sensor is composed of semiconductive material having a potential barrier therein.

SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

512+, for temperature-responsive circuitry containing a nonlinear solid-state element.