US PATENT SUBCLASS 374 / 103
.~.~.~ Time-temperature integration performed by particular circuit arrangement

Current as of: June, 1999
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374 /   HD   THERMAL MEASURING AND TESTING

100  DF  TEMPERATURE MEASUREMENT (E.G., THERMOMETER) {13}
101  DF  .~ Composite temperature-related paramenter {3}
102  DF  .~.~ Time-temperature relationship (e.g., integral, deterioration, change) {4}
103.~.~.~ Time-temperature integration performed by particular circuit arrangement

DEFINITION

Classification: 374/103

Time-temperature integration performed by particular circuit arrangement:

(under subclass 102) Subject matter having a detail of a component or arrangement of circuitry which integrates a

temperature-dependent electric signal with respect to time.