US PATENT SUBCLASS 374 / 102
.~.~ Time-temperature relationship (e.g., integral, deterioration, change)

Current as of: June, 1999
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374 /   HD   THERMAL MEASURING AND TESTING

100  DF  TEMPERATURE MEASUREMENT (E.G., THERMOMETER) {13}
101  DF  .~ Composite temperature-related paramenter {3}
102.~.~ Time-temperature relationship (e.g., integral, deterioration, change) {4}
103  DF  .~.~.~> Time-temperature integration performed by particular circuit arrangement
104  DF  .~.~.~> Peak (maximum or minimum) with respect to time {2}
107  DF  .~.~.~> Rate of change
108  DF  .~.~.~> Degree-days

DEFINITION

Classification: 374/102

Time-temperature relationship (e.g., integral, deterioration, change):

(under subclass 101) Subject matter wherein the quantitative determination is either, (1) functionally dependent upon, or (2) limited to the time elapsed during the measurement.

(1) Note. Included herein are measurements of time-temperature integrals or other deterioration representative functions.