(under subclass 189.01) Subject matter including the specifics of the memory which are tested for defects or erroneous information.
SEE OR SEARCH THIS CLASS, SUBCLASS:
200, where defective memory devices are used to store information.
SEE OR SEARCH CLASS
324, Electricity: Measuring and Testing,
34, for testing of magnetic properties.
714, Error Detection/Correction and Fault Detection/Recovery,
5+, for memory or peripheral subsystem affected recovery, subclass 42 for memory or storage device component fault, and subclass 54 for storage content error reliability testing in digital data processing systems, and subclasses 718+ for diagnostic testing of a memory system.
