Subject matter under 185.05 wherein the floating gate device has a provision for the substitution of dysfunctional ("bad") cells, either initially or from "wear-out" of an element or array, or for prevention of the generation of bad cells.
(1) Note. This subject matter includes means for increasing the "endurance" of an array.
SEE OR SEARCH CLASS
714, Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses.