US PATENT SUBCLASS 351 / 214
.~.~ Including diaphram or slit

Current as of: June, 1999
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351 /   HD   OPTICS: EYE EXAMINING, VISION TESTING AND CORRECTING

200  DF  EYE EXAMINING OR TESTING INSTRUMENT {7}
205  DF  .~ Objective type {10}
214.~.~ Including diaphram or slit

DEFINITION

Classification: 351/214

Including diaphragm of slit:

(under subclass 205) Subject matter in which a movable diaphragm or narrow slit is provided through which a strong light is passes into the eye being tested.

(1) Note. The above instruments employ usually artificial light, e.g., Neon light, and the diaphragm or slit is adjustable to determine refraction deficiencies of the eye.