US PATENT SUBCLASS 351 / 205
.~ Objective type

Current as of: June, 1999
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351 /   HD   OPTICS: EYE EXAMINING, VISION TESTING AND CORRECTING

200  DF  EYE EXAMINING OR TESTING INSTRUMENT {7}
205.~ Objective type {10}
206  DF  .~.~> Including eye photography {2}
209  DF  .~.~> Including eye movement detection {1}
211  DF  .~.~> Including projected target image {1}
213  DF  .~.~> Including light filter or absorber
214  DF  .~.~> Including diaphram or slit
215  DF  .~.~> Including light polarizing means
216  DF  .~.~> Including lens selectively insertable in optical path {1}
219  DF  .~.~> With contact lens
220  DF  .~.~> Including reflectors with off-set surfaces
221  DF  .~.~> Including illuminator

DEFINITION

Classification: 351/205

Objective type:

(under subclass 200) Subject matter including instruments for examining the eye of a patient independently of the patient's perceptions of responses, for example, by observing a light or image directed onto or into the eye to diagnose the eye or to ascertain the power of refraction.

SEE OR SEARCH THIS CLASS, SUBCLASS:

245, for instrument support.

SEE OR SEARCH CLASS

600, Surgery,

300+, for diagnostic instruments generally.