US PATENT SUBCLASS 33 / 824
.~.~.~.~.~ Other contact slidable on beam

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

700  DF  DISTANCE MEASURING {13}
783  DF  .~ Opposed contacts {10}
813  DF  .~.~ Micrometer {10}
821  DF  .~.~.~ With preliminary setting arrangement {4}
823  DF  .~.~.~.~ Micrometer slidably mounted on a beam {1}
824.~.~.~.~.~ Other contact slidable on beam

DEFINITION

Classification: 33/824

Other contact slidable on beam:

Subject matter under 823 wherein the other contact is also movable along the support.