US PATENT SUBCLASS 33 / 823
.~.~.~.~ Micrometer slidably mounted on a beam

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

700  DF  DISTANCE MEASURING {13}
783  DF  .~ Opposed contacts {10}
813  DF  .~.~ Micrometer {10}
821  DF  .~.~.~ With preliminary setting arrangement {4}
823.~.~.~.~ Micrometer slidably mounted on a beam {1}
824  DF  .~.~.~.~.~> Other contact slidable on beam

DEFINITION

Classification: 33/823

Micrometer slidably mounted on a beam:

(under subclass 821) Subject matter wherein a micrometer is movably mounted as a unit on a support for bringing one of the contacts to an approximate distance.