US PATENT SUBCLASS 33 / 544.6
.~.~.~ Only three probes


Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
542  DF  .~ Internal {6}
544.5  DF  .~.~ Having more than two probes {1}
544.6.~.~.~ Only three probes


DEFINITION

Classification: 33/544.6

Only three probes:

(under subclass 544.4) Subject matter wherein exactly three probes are used for gauging.