US PATENT SUBCLASS 33 / 544.6
.~.~.~ Only three probes
Current as of:
June, 1999
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33 /
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GEOMETRICAL INSTRUMENTS
501
DF
GAUGE
{61}
542
DF
.~ Internal {6}
544.5
DF
.~.~ Having more than two probes {1}
544.6
.~.~.~ Only three probes
DEFINITION
Classification: 33/544.6
Only three probes:
(under subclass 544.4) Subject matter wherein exactly three probes are used for gauging.