US PATENT SUBCLASS 33 / 544.5
.~.~ Having more than two probes

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
542  DF  .~ Internal {6}
544.5.~.~ Having more than two probes {1}
544.6  DF  .~.~.~> Only three probes

DEFINITION

Classification: 33/544.5

Having more than two probes:

(under subclass 542) Subject matter having at least three contact members that contact an object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

542.1, for telescoping caliper or stem gauge with two probes.