US PATENT SUBCLASS 33 / 544.3
.~.~.~.~ Biased probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
542  DF  .~ Internal {6}
544  DF  .~.~ Earth cavity or tube {2}
544.2  DF  .~.~.~ Having means to actuate probe {1}
544.3.~.~.~.~ Biased probe

DEFINITION

Classification: 33/544.3

Biased probe:

(under subclass 544.2) Subject matter having resilient means to urge the contact member into contact with the passageway or cavity.