US PATENT SUBCLASS 33 / 544.2
.~.~.~ Having means to actuate probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
542  DF  .~ Internal {6}
544  DF  .~.~ Earth cavity or tube {2}
544.2.~.~.~ Having means to actuate probe {1}
544.3  DF  .~.~.~.~> Biased probe

DEFINITION

Classification: 33/544.2

Having means to actuate probe:

(under subclass 544) Subject matter including means to move the contact member into contact with an object to be gauged.

SEE OR SEARCH THIS CLASS, SUBCLASS:

543, for concentricity or eccentricity gauge.