US PATENT SUBCLASS 33 / 501.17
.~.~.~ Plural probes

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.7  DF  .~ Tooth testing (e.g., gear, rack) {6}
501.14  DF  .~.~ By probe {3}
501.17.~.~.~ Plural probes {1}
501.18  DF  .~.~.~.~> Only two

DEFINITION

Classification: 33/501.17

Plural probes:

(under subclass 501.14) Subject matter having more than one contact member.