US PATENT SUBCLASS 33 / 501.14
.~.~ By probe

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.7  DF  .~ Tooth testing (e.g., gear, rack) {6}
501.14.~.~ By probe {3}
501.15  DF  .~.~.~> Teeth spacing
501.16  DF  .~.~.~> Including a master
501.17  DF  .~.~.~> Plural probes {1}

DEFINITION

Classification: 33/501.14

By probe:

(under subclass 501.7) Subject matter wherein the contact member has a slender elongated shape which contacts a tooth during a test.