US PATENT SUBCLASS 33 / 501.07
.~.~.~ Three contact probes

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.05  DF  .~ Comparator {3}
501.06  DF  .~.~ Beam type {1}
501.07.~.~.~ Three contact probes

DEFINITION

Classification: 33/501.07

Three contact probes:

(under subclass 501.06) Subject matter wherein the beam has three contact members mounted on it.