US PATENT SUBCLASS 33 / 501.06
.~.~ Beam type

Current as of: June, 1999
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33 /   HD   GEOMETRICAL INSTRUMENTS

501  DF  GAUGE {61}
501.05  DF  .~ Comparator {3}
501.06.~.~ Beam type {1}
501.07  DF  .~.~.~> Three contact probes

DEFINITION

Classification: 33/501.06

Beam type:

(under subclass 501.05) Subject matter having mounted on a bar or rod, at least two contact members of which at least one is movable.

SEE OR SEARCH THIS CLASS, SUBCLASS:

545, for comparison with a standard.

795, for a beam type measuring means.