(under subclass 524) Subject matter wherein an element burns out or is destroyed (i.e., is open circuited) in an
interconnection or integrated circuit structure component when applied current or voltage exceeds a predetermined limit.
SEE OR SEARCH CLASS
102, Ammunition and Explosives, appropriate subclasses for fuses relating to munitions.
326, Electronic Digital Logic Circuitry,
37+, for programmable logic.
365, Static Information Storage and Retrieval,
96, for fusible links relating to programmable read-only memory and subclass 200 for eliminating "bad bit" information associated with read/write circuits. 438, Semiconductor Device Manufacturing: Process,
467, 600, and 601 for methods of altering the conductivity of a fuse or antifuse element associated with a semiconductor integrated circuit.
