US PATENT SUBCLASS 257 / 657
.~ Stepped profile
Current as of:
June, 1999
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257 /
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ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES)
655
DF
WITH SPECIFIED IMPURITY CONCENTRATION GRADIENT
{2}
657
.~ Stepped profile
DEFINITION
Classification: 257/657
Stepped profile:
(under subclass 655) Subject matter wherein the device includes at least one region of the same conductivity type (P or N) wherein the doping concentration varies abruptly (e.g., a P+ to P- junction).