US PATENT SUBCLASS 257 / 617
INCLUDING REGION CONTAINING CRYSTAL DAMAGE
Current as of:
June, 1999
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257 /
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ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES)
617
INCLUDING REGION CONTAINING CRYSTAL DAMAGE
DEFINITION
Classification: 257/617
INCLUDING REGION CONTAINING CRYSTAL DAMAGE:
(under the class definition) Subject matter wherein the device includes a region which has crystal damage.
(1) Note. The crystal damage may have been caused by charged or elementary particles bombardment of a particular region.