US PATENT SUBCLASS 257 / 48
TEST OR CALIBRATION STRUCTURE

Current as of: June, 1999
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257 /   HD   ACTIVE SOLID-STATE DEVICES (E.G., TRANSISTORS, SOLID-STATE DIODES)

48TEST OR CALIBRATION STRUCTURE

DEFINITION

Classification: 257/48

TEST OR CALIBRATION STRUCTURE:

(under the class definition) Subject matter in which structures are provided on active solid-state devices to permit or facilitate the measurement, test, or calibration of the characteristics of the devices.

(1) Note. Active solid-state device standards are also included herein.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

158, for semiconductor device test apparatus and methods.

438, Semiconductor Device Manufacturing: Process, particularly

18, for methods under the class definition having combined therewith a step of measuring an electrical condition utilizing a test element.