US PATENT SUBCLASS 250 / 339.11
.~.~.~.~ Measuring infrared radiation reflected from sample

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

336.1  DF  INVISIBLE RADIANT ENERGY RESPONSIVE ELECTRIC SIGNALLING {16}
338.1  DF  .~ Infrared responsive {12}
339.01  DF  .~.~ With selection of plural discrete wavelengths or bands {6}
339.06  DF  .~.~.~ With radiation source {5}
339.11.~.~.~.~ Measuring infrared radiation reflected from sample

DEFINITION

Classification: 250/339.11

Measuring infrared radiation reflected from sample:

(under subclass 339.06) Subject matter wherein detection means are positioned to receive infrared radiation which has been reflected by a sample.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing,

445+, for light reflection systems in general.