US PATENT SUBCLASS 250 / 339.01
.~.~ With selection of plural discrete wavelengths or bands

Current as of: June, 1999
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250 /   HD   RADIANT ENERGY

336.1  DF  INVISIBLE RADIANT ENERGY RESPONSIVE ELECTRIC SIGNALLING {16}
338.1  DF  .~ Infrared responsive {12}
339.01.~.~ With selection of plural discrete wavelengths or bands {6}
339.02  DF  .~.~.~> Including detector array
339.03  DF  .~.~.~> Including temperature control means
339.04  DF  .~.~.~> Including temperature determining means
339.05  DF  .~.~.~> With additional noninfrared wavelengths
339.06  DF  .~.~.~> With radiation source {5}
339.14  DF  .~.~.~> Detecting infrared emissive objects {1}

DEFINITION

Classification: 250/339.01

With selection of plural discrete wavelengths or bands:

(under subclass 338.1) Subject matter having means to isolate from an infrared beam two or more of its components having different wavelengths or ranges of wavelengths and to direct the components simultaneously or at different times to the responsive means and methods involving the use of such means.

(1) Note. The subject matter of this subclass includes "infrared spectrometry" which includes, in addition to the means of the subclass, a sample of a material to be tested positioned in the infrared beam either before or after the selection means. The subject matter of this subclass does not include signalling means that have plural wavelengths or bands wherein only one wavelength or band is in the infrared region of the spectrum.

SEE OR SEARCH THIS CLASS, SUBCLASS:

370.06, for systems with means to differentiate between different wavelengths or types of invisible radiation.

503.1, for a radiation source for this class and a filter for the radiation source, the filter being an absorption filter or a prism or diffraction grating type filter.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing, 300+, for spectroscopic apparatus using visible light and dispersive devices; subclasses 319+ for spectrophotometers; and subclasses 405, 406, and 407 for spectroscopic apparatus using visible light and dispersive devices, subclasses 85+ for plural spectrophotometers, subclasses 96+ for spectrophotometers, per se, and subclasses 176, 177, and 178 for spectrophotometers of the plural filter type where only visible light tests are performed.