US PATENT SUBCLASS 209 / 237
.~.~ Material testing

Current as of: June, 1999
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209 /   HD   CLASSIFYING, SEPARATING, AND ASSORTING SOLIDS

233  DF  SIFTING {16}
235  DF  .~ Special applications {2}
237.~.~ Material testing

DEFINITION

Classification: 209/237

(under subclass 235) Sifting devices employed or adapted for sifting material to determine the proportion of each size in the whole.